Metrology Tools

Ferran Scientific, Inc.  
The Micropole(tm) Sensor System is used in a variety of high-vacuum applications such as semiconductor wafer processing to measure and monitor gas vapors.
Submitted: Oct 28, 2000
Nanometrics  
Manufacturer of film thickness and overlay/cd metrology systems. The primary market served by the Company is the semiconductor industry, which utilizes these products to monitor processes employed in the fabrication of advanced integrated circuits. The Company also manufactures overlay/cd metrology systems for the semiconductor industry.
Submitted: Dec 01, 2000
VLSI Standards, Inc.  
Developing measurement standards and associated services for the semiconductor and metrology related industries. VLSI Standards provides dozens of standards, products, and services to address every aspect of instrument calibration in the semiconductor and other industries requiring precise metrology.
Submitted: Dec 03, 2000
ADE Corporation  
Specializes in the design, manufacture, marketing and service of metrology and inspection systems for the silicon wafer and computer disk manufacturing industry.
Submitted: Oct 28, 2000
AXIC  
Developing unique solutions for analytical and process issues relative to semiconductor manufacturing. Manufacturer of equipment used for the measurement of thin films for composition and thickness.
Submitted: Oct 28, 2000
Conquer Industries, Inc.,  
Conquer Industries, Inc., is a Manufacturer's Representative Firm specializing in the sale of Semiconductor High Technology Capital Equipment. The New Equipment Division specializes in Wet Processing, Bulk Chemical Distribution Systems, ESC/ESD (Electrostatic Charge and Discharge Monitoring Equipment), Photolithography tracks, Wafer Handling, Transfer Systems, Diffusion and Metrology.
Submitted: Dec 11, 2000
LogicVision  
LogicVision is a leading provider of intellectual property and software products for the communication, networking, server and high-end consumer markets. Embedded ATE offers a complete test methodology, including at-speed test, diagnostics and debug for complex chips, boards and systems.
Submitted: Nov 13, 2000



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